Characterization, Testing of Nanotechnology Structures and Materials
course examines a variety of techniques and measurements essential for
testing and for controlling material fabrication and final device
performance. Characterization includes electrical, optical, physical,
and chemical approaches. The characterization experience will include
hands-on use of tools such as the Atomic Force Microscope (AFM),
Scanning Electron Microscope (SEM), fluorescence microscopes, and
fourier transform infrared spectroscopy.