E SC 216 - Undergraduate Level Course - Classroom Presentations

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E SC 211 / 212 / 213 / 214 / 215 / 216
E SC 216: Basic Characterization Techniques
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Lecture Video 
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Topics Covered
Unit 1 - Characterization Overview

Lecture 1: Touching, Seeing, Chemically Detecting, and Hearing at Our Size Scale

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E SC 216 Labs

Characterizing materials and structures at our size scale, the five senses, touching at our size scale, seeing at our size scale, chemically detecting at our size scale, hearing at our size scale, introduction to touching, seeing, chemically detecting, and hearing at the nano- scale
Lecture 2: The Use of Probes, Beams, and Waves for Characterization at the Nano-scale

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The tools for characterizing materials and structures at the nano-scale, probes, photon beams, electron beams, ion beams, acoustic waves
Unit 2 - Basic Characterization Techniques
Lecture 1: Basic Characterization Techniques

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E SC 216 Labs

Introduction, optical microscopes, profilometry, ellipsometry, reflective spectroscopy, contact angle
Unit 3 - Microscopy
Lecture 1:  Fundamental SEM Operation

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E SC 216 Labs

Overview of the physics of operation for the SEM

Lecture 2: Electron Microscopy Overview

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E SC 216 Labs
Scanning electron microscopy, field emission scanning electron microscopy, transmission electron microscopy, energy dispersive spectroscopy

Lecture 3: Fundamental FESEM Operation

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E SC 216 Labs Overview of the Zeiss FESEM.  Includes hardware function and operation software
Lecture 4: Focused Ion Beam (FIB): “Seeing” and “Processing” at the Nano-scale

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E SC 216 Labs FIB overview, FIB operation, FIB applications
Lecture 5: Confocal Microscopy

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E SC 216 Labs Introduction, optical microscopy, types of optical microscopes, confocal microscopy, examples
Lecture 6: SIMS

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E SC 216 Labs SIMS - Secondary Ion Mass Spectrometry. Overview - History, Principles of Operation, SIMS issues. 
Unit 4 - Probe Methods
Lecture 1: Advanced Scanning Probe Microscopy, Part 1

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E SC 216 Labs Overview of scanning probe techniques, scanning tunneling microscopy, atomic force microscopy, hardware and components, tip/sample interactions
Lecture 2: Advanced Scanning Probe Microscopy, Part 2

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E SC 216 Labs Common modes of operation, pitfalls and image artifacts, example of instrument operation
Unit 5 - X-Ray Methods
Lecture 1: X-Ray Photoelectron Spectroscopy (XPS)

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E SC 216 Labs Basic principles, instrumentation, peak characteristics, quantitative analysis, depth profiling
Lecture 2: Sample Preparation for Powder X-ray Diffraction

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E SC 216 Labs Typical methods used for sample preparation to obtain good data using X-Ray diffraction
Unit 6 - Fundamental Review
Lecture 1: Fundamentals of Metrology and Characterization for Nanotechnology

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E SC 216 Labs Common applications in nanotechnology